FIELD: physics.
SUBSTANCE: invention relates to testing of electronic unit incorporated with process parameter control device. Electronic unit 2 comprises large number of electrical parts. Part of electrical components are integrated in one group 5. Request signal is sent to group 5. Response of group 5 is received. Signal measured value is compared with preset value. Comparison allows forecasting future behavior of group components.
EFFECT: simplified control.
9 cl, 2 dwg
