METHOD OF MEASURING MAGNETIC PARAMETERS OF NANOMATERIALS Russian patent published in 2012 - IPC G01R33/00 B82B1/00 

Abstract RU 2449303 C1

FIELD: physics.

SUBSTANCE: method of measuring magnetic parameters of nanomaterials involves measuring the ferromagnetic resonance (FMR) spectrum. The apparatus is then calibrated using a standard specimen. Ferromagnetic resonance parameters are measured in a constant magnetic field while scanning at microwave frequency and simultaneously recording four S parameters. Modulus and phase of each parameter are determined such that, for a fixed magnetic field, the corresponding resonance frequency and width of the FMR line are found as the average value of eight measurements, which significantly increases their accuracy and enables to estimate root-mean-square random error.

EFFECT: wider frequency range and high measurement accuracy with low labour input.

1 tbl, 2 dwg

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RU 2 449 303 C1

Authors

Ignat'Ev Aleksandr Anatol'Evich

Kulikov Mikhail Nikolaevich

Ljashenko Aleksandr Viktorovich

Vasil'Ev Aleksandr Vasil'Evich

Maslov Andrej Alekseevich

Dates

2012-04-27Published

2010-09-13Filed