STATIC ION MASS ANALYSER Russian patent published in 2012 - IPC H01J49/26 

FIELD: instrument making.

SUBSTANCE: static ion mass analyser comprises a source of ions, a focusing system, an object slot, an aperture diaphragm, energy-dispersed electrostatic sector and magnet sector. The electrostatic sector is installed relative to the magnetic sector so that directions of optical axes rotation in the electrostatic sector and the magnetic sector match each other. The electrostatic sector is installed relative to the source of ions so that the plane of the optical image of the object slot is located between the electrostatic sector and the magnetic sector. In the plane of the optical image of the object slot there is an energy-filtering diaphragm. There is a collimating lens installed between the electrostatic sector and the magnetic sector.

EFFECT: higher resolution ability in a mode of simultaneous registration of ion mass spectrum under conditions of an energy-heterogeneous ion beam.

5 cl, 2 dwg