SYSTEM OF FUNCTIONAL TESTING CARDS OF SEMICONDUCTOR MEMORY Russian patent published in 2014 - IPC G06F11/26 G11C29/08 

FIELD: testing technology.

SUBSTANCE: invention relates to testing technology and can be used to diagnose functioning and determining the reliability margin of the semiconductor memory cards. The system consists of the control automatic unit, the interface controller Ethernet, the random access memory, the interface controller of semiconductor memory card, the unit of control registers, the unit of forming and measuring time parameters of the memory card interface with a resolution of 2.5 ns, the frequency multiplier based on the phase-locked loop, the control unit of input device and the display device, the unit of transceiver of the serial interface, the programmable logic integrated circuit, the microcircuit chip of transceiver of the interface Ethernet, the secondary power supply, the constant reprogrammable memory, the voltage level converter of the memory card interface, the clock signal generator 25 MHz, the input device, the display device, the temperature sensor of the memory card, the controlled power supply with the output voltage from 1 V to 5 V, the current sensor, and the contact device for connecting the semiconductor memory card.

EFFECT: ensuring the possibility of determining the reliability margin of the tested device.

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