SPECTROMETER-RADIOMETER FOR SIMULTANEOUS ANALYSIS OF CHARACTERISTICS OF MIXED FIELDS OF ALPHA-, BETA- AND GAMMA-RADIATION BASED ON COMPOSITE DETECTOR Russian patent published in 2015 - IPC G01T1/20 

FIELD: instrument engineering.

SUBSTANCE: spectrometer-radiometer for the simultaneous analysis of the characteristics of mixed fields of alpha-, beta- and gamma-radiation on the basis of the combined detector consisting of a semiconductor "transmission" detector for the registration of alpha-radiation (which acts as a silicon detector having the thickness of 200-300 mcm), an organic scintillator (which acts as paraterphenyl having the thickness of 7 mm), and the crystal scintillator NaI(Tl). For registration of beta radiation the signals of the silicon detector and the paraterphenyl are used, the registration of gamma-radiation is carried out using the scintillator NaI(Tl). The semiconductor silicon detector is located at the side of the inlet window of the combined detector close to the paraterphenyl. The scintillator NaI(Tl) is located behind the paraterphenyl and is mounted close to the photoelectron multiplier. Between the scintillators NaI(Tl) and the paraterphenyl the quartz glass is placed. The assembly of paraterphenyl, NaI(Tl), quartz glass and the photoelectron multiplier is a phoswich detector of the two scintillators.

EFFECT: improvement of efficiency of the separation of beta- and gamma-radiation.

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