FIELD: physics.
SUBSTANCE: test-chart of every channel in the combined optoelectronic system (COES) is composed by a series of lines creating the high spatial frequency (HSF) toward the MPHR line and stretched toward frame scan. Test-chart lines HSF images in the MPHR plane approximate to Nyquist frequency but are not equal thereto. Phase shift of said test-chart lines images over its entire length relative to MPHR elements are selected to exceed the MHPR element sizes some 2-10 times. Pair of lines with low spatial frequency (LSF) are applied on the edges of both lines. Left boundaries of HSF central lines of the test-chart are located on one vertical line. Lower boundary of test-chart in channel 1 and upper boundary of channel 2 contact each other. At control over channels, measured is the shift of loops and instabilities in the series of HSF signals to calculate the deflection of optical axis of every COES channel in the direction of line scan. Calculated is the swing of signal from LSF lines in both channels to calculate from their amplitude the angle turn of channels boresights in direction perpendicular to line scan.
EFFECT: higher accuracy of measurement of residual spatial misalignment of channels, location of boundaries and mutual turn of the fields.
9 dwg
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Authors
Dates
2016-06-20—Published
2012-09-03—Filed