FIELD: optics; instrument engineering.
SUBSTANCE: invention relates to the field of optical instrumentation and concerns a method for determining the resolution and linear resolution of optical-electronic systems. Method includes shooting test objects using an optical-electronic system, image analysis and processing. Symbols representing a two-dimensional regular structure of dark and light modules are used as test objects, linear dimensions of which characterize the spatial frequency of test objects, information about which is encoded by the structure of characters in binary format. Analysis and processing of images consists in the selection of fragments containing the symbols of test objects, and the subsequent decryption of information encoded in the symbols of test objects. Next, the smallest successfully decrypted symbol is selected by area, the decoded information from which corresponds to the information characterizing the spatial frequency of the test object, the value of which is calculated local and / or integral values of resolution and linear resolution.
EFFECT: technical result consists in increasing the accuracy and ensuring the possibility of automating the measurement process.
9 cl, 4 dwg
