METHOD OF ANALYSING DEFECTS AND DEVICE FOR INVESTIGATION OF DEFECTS Russian patent published in 2016 - IPC G01N29/04 

Abstract RU 2589491 C1

FIELD: physics.

SUBSTANCE: method of analysing defects includes following: first step of supply of high-frequency signal into multiple inductance coils, which are located adjacent to each other so that they partially overlap each other, in electromagnetic ultrasonic probe for generating ultrasonic vibrations in analysed object; second step of receiving B-echo ultrasonic oscillations using each of multiple inductance coils; third step of receiving F-echo ultrasonic oscillations using each of multiple inductance coils; fourth step of correction signal intensity B-echo received by each of multiple inductance coils, based on working state of each of multiple inductance coils; and fifth step of calculation of ratio by dividing signal intensity F-echo on intensity of corrected signal B-echo for each of multiple inductance coils and evaluation of internal defect of investigated object based on results of calculation of ratio.

EFFECT: high accuracy of estimating internal defect of gap between surface of investigated object and inductance coil.

9 cl, 9 dwg

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RU 2 589 491 C1

Authors

Ikeda Keisiro

Tasaka Takakhiro

Iikhosi Masanori

Dates

2016-07-10Published

2013-09-27Filed