FIELD: metal processing.
SUBSTANCE: invention can be used for indirect control of quality characteristics (size and different properties) of metal semi-finished products (band, wire, pipes, profile, etc.) and control of deformation modes in case of a characteristic quality does not comply with required restrictions. Core of the invention is that the indirect control is performed by crystallographic texture X-ray analysis, as the result of which the texture parameter is determined uniquely showing the deformation texture formation degree and closely connected with the target characteristics of quality.
EFFECT: technical result is the possibility of obtaining required characteristics of the semi-product quality.
1 cl, 3 dwg
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