METHOD FOR DETERMINATION OF CRYSTALLOGRAPHIC TEXTURE OF AXISYMMETRIC BILLETS Russian patent published in 2009 - IPC G01N23/20 

FIELD: physics, measurements.

SUBSTANCE: application: to determine crystallographic texture of axisymmetric billets. Preparatory stage is carried out to produce calibration dependences, which includes stage of X-ray analysis that consists of sampling, pickup of three reverse pole figures on sites of samples characterised by normal lines directed along radius, along chord and along axis of billet, calculation is carried out by produced descriptions of pole figures for three parameters of anisotropy f_z, f_r, f_φ where r, φ, z characterise radial, chord and axial directions of normal lines, measurement of hardness on sites with normal lines directed along radius, along chord HV_φ, along axis HV_z, calculation of dimensionless coefficients K_HVr=HV_r/HV_z, K_HVφ,=H_Vφ/HV_z, for building of calibration dependences formulas in the form of f_r=1/3-b_r(l-K_HVr), f_φ=1/3-b_φ (1-K_HVφ), where b_r and b_φ are empirical coefficients, afterwards the main stage is realised, consisting of sampling, measurement of hardness in three orthogonal directions on sites with normal lines directed along radius HV_r, along chord HV_φ, along longitudinal axis HV_z, calculation of dimensionless coefficients K_HVr=HV_r/_HVz, KHV_φ,=HV_φ/HV_z, calculation of two anisotropy parametres by formulas of calibration dependences produced at preparatory stage, and calculation of the third anisotropy parametre by formula f_z=1-f_r-f_φ.

EFFECT: simplified procedure for determination of crystallographic texture.

10 dwg