ADJUSTMENT OF DISTANCE FROM SOURCE LATTICE TO PHASE LATTICE FOR MULTIPLE ORDER PHASE SETTINGS IN DIFFERENTIAL PHASE-CONTRAST IMAGING Russian patent published in 2017 - IPC A61B6/00 G01N23/20 

FIELD: medicine.

SUBSTANCE: system includes a differential phase-contrast installation with an x-ray source and detector, a layout of lattices containing a source lattice, a phase lattice and an analyzer lattice, whwhere the source lattice is located between the x-ray source and the phase lattice, and the analyzer lattice is located between the phase lattice and the detector, and a movement arrangement for relative movement between the researched object and at least one lattice, a processing unit and a source lattice displacement arrangement. The phase lattice, the analyzer lattice and the detector are provided as a fixed interferometer unit. The phase lattice and the analyzer lattice are installed parallel to each other. The source lattice is unbalanced relative to the interferometer unit so that moire interference fringes can be detected in the detector plane. The processing unit is adapted to detect the moire fringes in the signals issued by the detector with x-rays, and is further configured to compute the source lattice movement signal to achieve a predetermined moire pattern. The movement arrangement is configured to adjust the location of the source lattice at least in the x-ray projection direction based on the displacement signal magnitude, so that at least one moire strip appeares across the width D of the detector. The method is implemented through system operation. The computer-readable storage medium contains instructions for method steps implementation by the system.

EFFECT: use of inventions allows to simplify adjustment and regulation of the differential phase-contrast imaging system.

7 cl, 5 dwg