DIFFRACTION METHOD FOR DEFINITION OF INTERNAL DEFECTS OF PRODUCTS IMPLEMENTED BY ADDITIVE TECHNOLOGY Russian patent published in 2018 - IPC G01N21/35 

FIELD: defectoscopy.

SUBSTANCE: invention relates to non-destructive methods for detecting defects in products made with additive technology of non-metallic materials transparent to electromagnetic waves with lengths of 10^-4 to 10^-3 meter, and can be used to automatically detect hidden structure defects. Method includes detecting fabrication defects, such as cracks, voids, cavities, pores commensurate in magnitude with the length of the monochromatic wave passing through the material under investigation. When the electromagnetic wave interacts with a defect, a diffraction effect occurs. Diffraction pattern is projected onto the screen behind the object under investigation and consists of bolometric cells sensitive to terahertz radiation. Diffraction pattern is read from the screen and converted into a computer image suitable for later analysis.

EFFECT: simplification of the procedure for fixing the presence of a defect and its safety in comparison with similar methods of X-ray tomography due to the use of non-ionizing radiation.

1 cl, 3 dwg