FIELD: physics.
SUBSTANCE: method of determining refraction index of surface electromagnetic waves (SEW) involves formation of an interference pattern resulting from interference of the reference electromagnetic wave with a wave produced by the initial beam of surface electromagnetic waves. The reference wave is in form of a new beam of surface electromagnetic waves, formed by separating part of the rays from the initial beam, where plane wave fronts are chosen. An interference pattern is formed through superposition of both beams of surface electromagnetic waves, and the said pattern is recorded in a plane which is parallel the surface of the sample.
EFFECT: increased accuracy and cutting on measurement time.
3 dwg
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