METRIC GENERALIZED PARAMETER FORMING FOR A/B TESTING METHODS AND SYSTEM Russian patent published in 2018 - IPC G06F17/00 

FIELD: information technologies.

SUBSTANCE: group of inventions relates to the network services testing means. Proposed is the A/B-testing generalized metric parameter generation method and system, including: obtaining the metric first parameter for the first and second pluralities of feature vectors, wherein the metric first parameters combination indicates the users' actions changes direction during the transition from the control version to the experimental version; obtaining the metric second parameter for the first and second pluralities of feature vectors, wherein the metric second parameters combination indicates the users’ actions changes amount during the transition from the control version to the experimental version; metric generalized parameter formation for the first and second pluralities of feature vectors, wherein the metric generalized parameters together indicate the users’ actions changes amount and direction during the transition from the control version to the experimental version.

EFFECT: increase in the services testing accuracy.

28 cl, 3 dwg