FIELD: computer equipment.
SUBSTANCE: invention relates to the field of computer technology, namely systems on a chip containing internal memory with spare elements and built-in self-test units. Built-in self-repair memory with spare elements includes a state machine, a control logic block, and a reserve element configuration generator.
EFFECT: technical result consists in providing the possibility of using spare memory elements in the process of the microcircuit operation by supplying the device with an output signal of serviceability of reserve elements.
3 cl, 9 dwg
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