FIELD: information technology.
SUBSTANCE: invention relates to a method and a device for comparing similar elements of high-dimensional image features. Device comprises a unit for reducing dimensionality of features to reduce dimensions of extracted proper image vectors by LSH algorithm to obtain low-dimensional eigen vectors; a segmentation indexing module for segmentation with averaging of low-dimensional eigen vectors and generating a table of segment indices; module for requesting similar elements to extract a segmented low-dimensional eigenvector of the requested image from a table of segment indices to obtain a set of candidate samples and a metric comparison module for presenting a similarity score between each sample in the candidate samples set and the low-dimensional eigenvector of the requested image.
EFFECT: high speed and accuracy of determining similar image elements.
14 cl, 7 dwg
