FIELD: physics.
SUBSTANCE: invention relates to a method of detecting parasitic pixels in a matrix of pixels of an image capturing device sensitive to infrared radiation. Method comprises: receiving an input image; estimating an estimated index for a plurality of target pixels comprising some pixels of pixels of the input image, wherein the estimated index for each target pixel is generated based on k pixels of the input image selected in window H × H pixels around target pixel; and detecting that at least one pixel of the target pixels is a parasite pixel based on the calculated estimates.
EFFECT: technical result consists in efficient detection of bad pixels.
15 cl, 8 dwg
