APPARATUS FOR DETERMINING QUALITY OF OPTICAL ELEMENTS Russian patent published in 2020 - IPC G01N21/63 G01B9/02 

FIELD: optoelectronics.

SUBSTANCE: invention relates to optoelectronics and can be used in making optical devices based on optical crystals. Proposed apparatus for determining the degree of defectiveness of optical elements by laser interferometry involves a helium-neon laser, a collimator, a Mach–Zehnder interferometer, one sample of which is fitted with the analyzed sample. At that, the sample holder is a collet clamp from dielectric material, which enables to turn the sample about an axis coinciding with the laser beam passing through the sample, as well as supply voltage to opposite sides of sample in order to detect defects, sensitive to direction of polarization of light and applied to electric field.

EFFECT: determination of internal and external optical inhomogeneities of crystals, including defects sensitive both to polarization of light, and to external electric field.

1 cl, 2 dwg