FIELD: defectoscopy.
SUBSTANCE: invention relates to non-destructive testing and can be used for high-efficiency quality control, including scanning of surface of controlled object. Essence of invention consists in that multielement eddy current converter is equipped with identical two first M additional rulers with axes parallel to axis x, adjacent main and additional rulers are successively shifted relative to each other along the y axis by the value Dy, and each successive k+1-th line (k = 1, 2, ..., M+1) is offset along the x-axis relative to the previous k-th line on value dcm = Dx/(M+2).
EFFECT: high resolution of control.
1 cl, 2 dwg
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