ULTRAHIGH FREQUENCY DEVICE FOR DETERMINING ELECTROPHYSICAL PARAMETERS FOR EVALUATING DEFECTS IN MULTILAYER DIELECTRIC AND MAGNETODIELECTRIC COATINGS Russian patent published in 2021 - IPC G01N33/02 

Abstract RU 2759151 C1

FIELD: electrical engineering.

SUBSTANCE: invention relates to electrical engineering and can be used to determine electrophysical parameters, detect and evaluate defects in multilayer dielectric and magnetodielectric coatings on the metal surface when developing multilayer radio-absorbing coatings in aviation, as well as in chemical, paint and other industries. The technical result of the invention is an increase of the speed and reliability of the device by increasing the accuracy of determining the electrophysical parameters of the layers of multilayer coatings, increasing the probability of detecting interlayer defects in them, as well as the accuracy of estimating their geometric parameters (heights) and position relative to the layers of a multilayer dielectric coating. The specified technical result is achieved by the fact that a switching unit of antennas connected in series with a control unit, a synchronization unit, a movement mechanism interacting with receiving antennas, as well as a signal processing unit are introduced into the known microwave device.

EFFECT: increased speed and reliability of the device by increasing accuracy of determining the electrophysical parameters of the layers of multilayer coatings.

1 cl, 1 dwg

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RU 2 759 151 C1

Authors

Kazmin Aleksandr Igorevich

Fedyunin Dmitrij Pavlovich

Fedyunin Pavel Aleksandrovich

Blinov Andrej Vladimirovich

Dates

2021-11-09Published

2020-11-18Filed