FIELD: information; measuring technology.
SUBSTANCE: invention is related in particular to methods for determining the resolution of digital optoelectronic systems and devices for its implementation. The method includes capturing a test object using a digital optoelectronic system and analysing the resulting digital images. The test object includes 4 line patterns with an arcuate structure of elements with decreasing spatial frequency, located at angles of 0°, 90°, 180°, 270° relative to the central element consisting of four alternating black and white squares. The analysis of the obtained digital images consists in an automated search for the coordinates of the boundary of the separate reproduction of elements corresponding to the spatial frequency that determines the value of the resolution of the digital optoelectronic system.
EFFECT: increasing the accuracy of measuring resolution and reducing the time of the measurement process by providing the possibility of automating the measurement process.
3 cl, 3 dwg
