FLAW FINDER SYSTEM AND FLAW DETECTOR Russian patent published in 2023 - IPC G01N29/22 

FIELD: non-destructive testing of materials.

SUBSTANCE: system of probes of a flaw detector designed for non-destructive testing of material by moving the test sample relative to the system of probes in the direction of testing comprises a base mount that defines a longitudinal direction aligned parallel to the direction of testing, and a transverse direction aligned perpendicular to the direction of testing, and comprising several probe holders arranged in a row next to each other in the transverse direction. Each probe holder comprises a first probe area provided with at least one first probe and a second probe area provided with at least one probe seeker. Each searcher zone determines the effective control width in such a way that when the test sample is moved relative to the probe system in the direction of testing along the probe zone, the effective control width allows you to control the control strip without gaps. The first control zone and the second control zone of the probe holder are located with an offset relative to each other parallel to the longitudinal direction and the transverse direction in such a way that the first control strip covered by the first probe zone of the probe holder, on the one hand, without a gap, passes into the second control strip covered by the second zone probes of the same probe holder, and on the opposite side, without a gap, it passes into the second control strip covered by the second probe zone of the probe holder located directly next to it.

EFFECT: providing the possibility of developing a system of probes of a flaw detector for non-destructive testing of materials with a relative movement of the test sample relative to the system of probes, which will allow full inspection of the surface and will have a simple design.

10 cl, 9 dwg