SUPERPOSITION RING DIFFRACTOMETER Russian patent published in 2023 - IPC G01N23/20 

FIELD: diffraction measurements.

SUBSTANCE: superposition ring diffractometer is designed to study the crystal structure of materials using the Debye-Scherrer and Laue methods using X-ray, synchrotron and neutron beams. The diffractometer contains at least one ionizing radiation detector located on the ring. The detector or array of detectors rotates on a moving system along the radius of a ring, in the center of which the sample under study is located. The ring with the detector located on it, in turn, can be rotated perpendicular to the axis of the beam incident on the sample.

EFFECT: increase in the solid angle of radiation capture, a decrease in the time of the experiment, as well as the ability to vary the resolution of the diffractometer.

2 cl, 3 dwg