METHOD OF X-RAY ANALYSIS Russian patent published in 1999 - IPC

FIELD: X-ray test of crystallogeometric parameters of large-angle boundaries of grains described by tetragonal lattices of matching units in polycrystalline materials with any size of grain. SUBSTANCE: invention is meant for integral determination of texture of mentioned boundaries and for increased precision of determination of orientations of individual pairs of grains in metal mass-produced rolled product with any size of grain. Textural attachment of diffractometer is turned through angles θ and α proceeding from phantom K_α diffraction ( hkl ) of lattices of matching units, diffraction picture in the form of β profile in system of outer axes of sample is generated. Azimuthal angles of maxima of intensity of Laue spectrum from bench marks - planes ( HKL)(HKL)₁ and (HKL)(HKL)₂ with equal multiple interplane distances parallel in pairs of crystallites are calculated in system of axes of goniometer. Precise orientations of grains forming special boundaries are computed from orientation relations. EFFECT: increased precision of determination of orientations of individual pairs of grains in metal rolled product with any size of grain. 2 dwg, 1 tbl