FIELD: computer engineering.
SUBSTANCE: invention relates to computer engineering. When writing each functional test, the number of controlled points is determined and the test is checked using the tested software of the electronic device, i.e. triggering each control point in the test by simulating an error in data from the software of the electronic device. Error is simulated by reading data from the tested software of the electronic device and substituting data therein. When performing data substitution, during the test, the control equipment performs rewriting of data from the tested software of the electronic device in its own random access memory in accordance with the specified error, thus, detection of error in test control point is worked out. If an error is detected by a control point, the next control point of this test is checked, by imitating a new error in the software data of the electronic device, and upon completion of the test, the next functional test is written.
EFFECT: high reliability of the electronic device due to high reliability and quality of testing its software.
1 cl, 2 dwg
Authors
Dates
2024-04-11—Published
2023-10-03—Filed