FIELD: computer technology.
SUBSTANCE: invention relates to a method for diagnosing a complex for testing electronic devices. Diagnostics of the testing complex is carried out for all ports of the electronic device and ensures the verification of their initialization and configurability and the exchange of data on them with the control equipment. For the ports of an electronic device, diagnostics are carried out in such a way that diagnostics are carried out by the control diagnostic software of the control equipment with the formation of diagnostic information on the slave ports of the electronic device, and for the leading ports, diagnostics are performed by the service diagnostic software of the electronic device with the formation of diagnostic information for reading by the control diagnostic software control equipment.
EFFECT: increased reliability of the testing complex due to the universal diagnostics of the equipment elements of the complex before each use for its intended purpose; increased reliability of tests through the use of a guaranteed serviceable testing complex.
2 cl, 1 dwg
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Authors
Dates
2023-08-31—Published
2023-01-11—Filed