FIELD: measurement equipment.
SUBSTANCE: invention relates to measurement equipment to be used for control over integrity of conducting coatings on dielectrics. Proposed method consists in bringing dielectric in contact with electrode and measuring capacity between said electrode and current conducting layer to define layer thickness from magnitude of capacity. Then, layer surface is scanned by composite material by switching its components in turns to displace one of said components in revealed defective zones in controlled layer.
EFFECT: higher accuracy of current conducting layer area measurement.
1 cl, 12 dwg
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