INTERFEROMETER FOR MEASURING DISPLACEMENTS Russian patent published in 1994 - IPC

FIELD: measuring technology. SUBSTANCE: device has a single-frequency laser for generating linearly polarized radiation, telescopic system, light splitter, two corner reflectors one of which is located in a measuring arm and the other is located in a reference arm, quarter-wave plate located in the measuring arm and two polarizers. The light passed through all these components is applied into a photoelectric system for processing quadrature interference signals occurring due to the fact that the polarizers are located such that their main transmission axes are orthogonal to each other and disposed at an angle of 45 ± 1^° to the laser radiation polarization direction. EFFECT: simplified construction and enhanced measurement accuracy. 1 dwg