PROCESS OF DETERMINATION OF FLAW IN TRANSPARENT STONE Russian patent published in 1995 - IPC

Abstract RU 2035039 C1

FIELD: analysis of materials. SUBSTANCE: process provides for such orientation of transparent stone in field of vision of amplifying device that pattern of flaw is seen through its flat face and measurements of parameters determining its position, in particular, angle between faces of transparent stone, distances between patterns of flaw and finding of its position depending on measured parameters are possible. EFFECT: enhanced authenticity of determination of flaws. 1 dwg

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RU 2 035 039 C1

Authors

Kungurov A.I.

Zhil'Tsov A.N.

Sharapov A.P.

Ulanov N.E.

Dates

1995-05-10—Published

1992-05-26—Filed