FIELD: optical instrument engineering. SUBSTANCE: method is based upon reception of interference image of light radiation source. Path-length difference is compensated according to test results among optical beams from system subapertures. Initial value of path-length difference of optical beams ΔSo is determined. Interference image is registered at spectral range with width of , where λ is average wavelength of light radiation. Interference pattern contrast distribution is determined, and interference pattern luminosity distribution is determined from the value of contrast. Values of luminosity relation are formed at different areas. According to relation formed, values of path-length difference of optical beams of system subapertures are determined, and after that the system should be compensated. EFFECT: improved precision; improved reliability of operation. 1 dwg
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Authors
Dates
1995-08-27—Published
1986-10-31—Filed