METHOD OF PHOTOMETRIC DETERMINATION OF FLAWS AND DEVICE FOR ITS IMPLEMENTATION Russian patent published in 1995 - IPC

Abstract RU 2051376 C1

FIELD: flaw detection. SUBSTANCE: integral intensities of components of laser radiation diffusively scattered backward and forward from section illuminated by laser beam are measured. Presence of flaw is found by values of these intensities and by their ratio. Flaw is detected with the help of photometric device composed of laser, photometric units with integrating spaces with holes and photodetectors for registration of diffusive components and measurement unit. EFFECT: improved authenticity of flaw detection. 6 cl, 3 dwg

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RU 2 051 376 C1

Authors

Krylov Jurij Nikolaevich[By]

Sokolov Evgenij Aleksandrovich[By]

Tatarchenko Raisa Aleksandrovna[By]

Kazakov Nikolaj Pavlovich[By]

Kostjutkin Vladimir Grigor'Evich[By]

Dates

1995-12-27Published

1992-04-28Filed