FIELD: X-ray structural analysis. SUBSTANCE: analyzer has through-target X-ray tube, sample holder placed opposite X-ray tube, crystal analyzers, and X-radiation detectors with measuring equipment. Capillary lens is placed between X-ray tube and sample being irradiated to obtain parallel beam of X-rays incident on sample. Flat crystal analyzers are placed in immediate proximity of irradiated sample and secured on turret assembly whose turn enables their setting in two positions relative to detectors. Each crystal analyzer has two focusing positions in working state relative to flat surface of irradiated sample. EFFECT: provision for detecting up to sixteen elements in same sample of material in condensed phase. 1 dwg
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