FIELD: physics.
SUBSTANCE: apparatus for carrying out both x-ray diffraction (XRD) and x-ray fluorescence (XRF) analysis of a crystalline sample, comprising an evacuable chamber; a sample holder located in the evacuable chamber, for mounting the crystalline sample so that it can be analysed; an XRF tube mounted in the evacuable chamber, for illuminating the crystalline sample with x-rays; an XRF detection arrangement for detecting secondary x-rays emitted from the surface of the crystalline sample as a result of illumination by x-rays from the XRF tube; an XRD tube, also mounted in the evacuable chamber but separate from the XRF tube, for illuminating the crystalline sample with x-rays; an XRD detection arrangement for detecting x-rays of a characteristic wavelength which have been diffracted by the crystalline sample; and a moveable XRD support assembly, comprising a first part configured to mount the XRD tube for movement of the XRD tube relative the sample holder, and a second part configured to mount the XRD detection arrangement for movement of the XRD detection arrangement relative the sample holder.
EFFECT: possibility of more accurately carrying out both x-ray diffraction and x-ray fluorescence analysis of a crystalline sample.
13 cl, 4 dwg
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Authors
Dates
2012-05-10—Published
2008-02-28—Filed