FIELD: radiomeasuring engineering, devices for examination and check-up of quality of quartz wafers, piezoelectric elements, dipoles and quartz resonators according to rated parameters: series resonance frequency and dynamic resistance. SUBSTANCE: measuring quartz self-sustained oscillator has the first amplifier stage built around transistor 2, first and second resistors 3, 4, quartz resonator 5, measuring indicator 6, automatic gain control unit 7, resistors 8,9,10,11,12,13, isolating capacitors 14,15, capacitors 17,18, inductance coil 19, diode 20 and frequency meter 21. EFFECT: enhanced accuracy of measurement of basic technical characteristics of quartz resonators. 2 dwg
Title | Year | Author | Number |
---|---|---|---|
GEAR TESTING PARAMETERS OF QUARTZ CRYSTALLINE PLATES | 1993 |
|
RU2093844C1 |
TRANSDUCER OF RESISTANCE OF QUARTZ RESONATOR | 0 |
|
SU1615645A1 |
TEMPERATURE-COMPENSATED SELF-EXCITED CRYSTAL OSCILLATOR | 1993 |
|
RU2033683C1 |
0 |
|
SU357884A1 | |
QUARTZ AUTOGENERATOR | 0 |
|
SU629622A1 |
CONTROLLABLE CRYSTAL OSCILLATOR INCORPORATING PROVISION OF HIGH-RATIO FREQUENCY MULTIPLICATION | 2001 |
|
RU2207705C1 |
FREQUENCY-CONTROLLED TRANSISTOR-BASED QUARTZ GENERATOR | 0 |
|
SU773903A1 |
CRYSTAL SELF-OSCILLATOR | 0 |
|
SU970630A1 |
DISPLACEMENT METER | 2001 |
|
RU2213934C2 |
FREQUENCY-MODULATED GENERATOR | 2005 |
|
RU2295825C1 |
Authors
Dates
1997-03-20—Published
1993-11-12—Filed