GEAR TESTING PARAMETERS OF QUARTZ CRYSTALLINE PLATES Russian patent published in 1997 - IPC

FIELD: radio measurement technology for active test of frequency of series resonance and dynamic resistance of quartz crystalline plates and piezoelements during execution of technological operations of their manufacture, test and application. SUBSTANCE: gear testing parameters of quartz crystalline plates has two-stage amplifier on two transistors 1 and 2 connected by diagram with common emitter with circuit of positive feedback between collector of transistor 2 and base of transistor 1, measurement unit 14 incorporating mobile measurement electrode 16 made in the form of rod of magnetically hard material suspended above support 19 for positioning of tested quartz plates, signal level meter 15 connected to measurement electrode 16, unit 22 of automatic gain control to which signal input collector of transistor 1 is connected (output is connected to connection point of capacitor 24 and adjusting diode 23 which are placed into collector circuit of transistor 2), frequency meter 25 and oscillatory circuit composed of inductance 8 and capacitor 9 placed into circuit of transistor 2. Reference input of unit of automatic gain control is intended for supply of reference voltage U_ref. EFFECT: enhanced functional efficiency of gear. 2 dwg