DEVICE TESTING PARAMETERS OF DIELECTRIC COATS Russian patent published in 1997 - IPC

FIELD: nondestructive testing, inspection of quality of dielectric coats of articles in mechanical engineering, aviation, etc. SUBSTANCE: device includes voltage generator 1, voltage regulation unit 2, testing voltage former 3, puncture register 4 and first electrode connected in series, second electrode 6 connected to common bus control unit 7 placed between puncture register 4 and voltage regulation unit which third input is tie up with second input of testing voltage former 3 and is connected to second output of control unit 7 and indicator 8 connected to second output of voltage regulation unit 2. Voltage regulation unit 2 incorporates controlled master generator 9, counter 10 and digital-to-analog converter 11 which output is first output of voltage regulation unit 2 connected in series. Second input of counter 10 and input of master generator 9 are correspondingly first and second inputs of voltage regulation unit 2. Analog input of digital-to-analog converter 11 is third input and output of counter 10 is second output of voltage regulation unit 2. Testing voltage former 3 has commutator 12, transformer 13 and high-voltage rectifier 14 connected in series and placed ahead of second input of testing voltage former 3 which first input is second input of commutator 12. Puncture register 4 has first 15 and second 16 resistors connected in series, their connection point being linked to second output of puncture register 4, and pulse former 17 which output is first output of puncture register 4 and stabilizer diode 18 placed between input of pulse former 17 and common bus. Control unit 7 incorporates initial setting unit 19, 2AND gate 20 which second input is input of control unit 7 and flip-flop 21 which output is second output unit 7 connected in series, switching unit 22 connected to second input of flip-flop 21 and NOT gate 23 placed between output of initial setting unit 19 and first output of control unit 7. EFFECT: widened functional capabilities and increased testing accuracy. 4 cl, 1 dwg