FIELD: X-ray phase analysis. SUBSTANCE: analyzed and standard samples are irradiated by beam of X-rays. Diffraction spectrum is recorded in which one narrow but most informative section is chosen where reflection from each mineral present in sample and located close to each other is developed. Profile of overlapping diffraction reflexes is resolved above common background line with resolution into components and content of all minerals of sample is calculated by measured integral intensities. Accuracy of analysis corresponds to III category of accuracy of quantitative mineralogical analysis. EFFECT: improved authenticity. 1 dwg, 2 tbl
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Authors
Dates
1997-08-27—Published
1994-05-13—Filed