FIELD: measurement of surface roughness. SUBSTANCE: device has five detectors 13-17 of radiation reflected from surface placed in symmetry with reference to image direction. Computer of device generates averaged value of roughness parameters. EFFECT: increased accuracy of measurement of surface roughness of parts manufactured from material which reflecting properties depend on angle of light incidence. 1 dwg
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Authors
Dates
1997-10-10—Published
1994-09-12—Filed