FIELD: nondestructive inspection of objects. SUBSTANCE: device has X-ray source and recording system both connected to process system. Device is designed for irradiating part under inspection with waves of different lengths simultaneously and its recording system functions to simultaneously and independently record two or more wavelengths. Method involves irradiation of part being inspected with X-ray stream of two wavelengths at the same time recording reflected X-radiation at these wavelengths. In the process film coating is checked for changes in its thickness. Film density and roughness are calculated by adjusting points on theoretical curves to those on experimental curves. EFFECT: provision for in-process acquisition of unbiased data on film coating surface topography and growing layer density. 6 cl, 4 dwg, 1 ex
Title | Year | Author | Number |
---|---|---|---|
PROCEDURE TESTING PARAMETERS OF FILM COATS AND SURFACES IN PROCESS OF THEIR CHANGE AND DEVICE FOR IS IMPLEMENTATION | 1997 |
|
RU2199110C2 |
X-RAY FLUX CONTROL DEVICE AND ITS MANUFACTURING PROCESS | 1996 |
|
RU2109358C1 |
METHOD AND DEVICE FOR REDUCING OF SURFACE ROUGHNESS | 1997 |
|
RU2141005C1 |
METHOD TESTING PARAMETERS OF FILM COAT IN PROCESS OF CHANGE OF FILM THICKNESS ON BACKING AND DEVICE FOR ITS IMPLEMENTATION | 1995 |
|
RU2087861C1 |
METHOD FOR DETERMINING TEMPERATURE OF PHASE TRANSITIONS IN FILMS AND HIDDEN LAYERS OF MULTI-LAYER STRUCTURES OF NANOMETER RANGE OF THICKNESSES | 2017 |
|
RU2657330C1 |
X-RAY REFLECTOMETER | 1998 |
|
RU2129698C1 |
X-RAY REFLECTOMETER | 1999 |
|
RU2166184C2 |
METHOD OF REMOTE MEASUREMENT OF SURFACE ROUGHNESS PARAMETERS | 2013 |
|
RU2535519C2 |
X-RAY REFLECTOMETER | 1999 |
|
RU2176776C2 |
BEYOND ROWLAND SPECTROMETER FOR SOFT X-RAY AND VUV RANGE | 2015 |
|
RU2599923C1 |
Authors
Dates
2002-12-10—Published
1998-04-29—Filed