OPTICO-ELECTRON METER OF ANGLE OF TURN OF ALIDADE Russian patent published in 1997 - IPC

FIELD: measurement technology, precision measurement of angle of turn of object placed on alidade. SUBSTANCE: optico-electron meter includes path of coarse measurements of α angle and path of precise measurement of Da angle. Optico-mechanical part of meter has disc of scanner with n slots located on its periphery. One of slots has bigger length. Four optrons are matched with peripheral slots of disc which makes it possible to calculate precise values of angle and to add these values to values measured in path of coarse measurements. EFFECT: increased precision of measurement of angle of turn. 3 dwg