DEVICE FOR SIMULATION OF FAULTS AND IN-CIRCUIT TESTING OF DIGITAL EQUIPMENT ELEMENTS Russian patent published in 1997 - IPC

FIELD: computer engineering, in particular, debugging and testing of digital equipment. SUBSTANCE: device has commutator 1, which is connected to element to be tested, fault generator 2, switching control unit 3, fault decoder 4, simulation mode setting unit 5, threshold gates unit 6, external control unit 7. Device provides possibility to simulate faults on single or several terminals of digital elements, operate with elements with two-direction lines as well as possibility to be used as universal digital in-circuit tester due to hardware-software protection of device channels against overload when terminals of tested element are contacted. EFFECT: increased functional capabilities. 7 cl, 8 dwg