METHOD OF DETERMINATION OF DIELECTRIC COATING POROSITY OF OPTICAL MEMBERS MADE OF COPPER AND ITS ALLOYS Russian patent published in 1997 - IPC

FIELD: examination and analysis of materials. SUBSTANCE: optical member under examination which has dielectric coating is placed in electrolyte solution, and current value is measured at different values of voltage. Then optical member being examined is replaced by standard optical member without dielectric coating, manufactured of the same material. Standard optical member is positioned in the same way as optical member being examined, current value is measured at different values of voltage, and dielectric coating porosity is determined by formula: , where χ is dielectric coating porosity, per cent; α₁ is slope of voltampere characteristics to abscissa axis when measuring the examined specimen; α₂ is slope of voltampere characteristic to abscissa axis when measuring the standard specimen. Buffer system at pH 6.6-9.4 with additive of 0.004 per cent by weight of 1, 2, 3-benzotriazole. EFFECT: more effective determination of porosity. 9 tbl, 11 dwg