FIELD: examination of parameters of thin dielectric films. SUBSTANCE: method includes formation of optical contact area between waveguide surface and coupling element made of two or more interconnected parts insulated optically from each other. Method also includes removal of radiation from waveguide, measurement of angular distribution of intensity of radiation passed through waveguide, and calculation of waveguide parameters by angular distribution. EFFECT: enhanced accuracy of measurements. 1 dwg
| Title | Year | Author | Number |
|---|---|---|---|
| METHOD OF INVESTIGATION OF PLANAR OPTICAL WAVEGUIDE AND DEVICE FOR ITS IMPLEMENTATION | 1990 |
|
RU2014584C1 |
| METHOD OF PLANAR LIGHT PIPE INVESTIGATION | 0 |
|
SU1728833A1 |
| PLANAR OPTICAL WAVEGUIDE PARAMETERS DETERMINATION METHOD | 0 |
|
SU1732314A1 |
| METHOD FOR EXCITATION PLANAR OPTICAL LIGHT GUIDE | 1991 |
|
RU2017177C1 |
| METHOD FOR TESTING PLANAR OPTICAL WAVEGUIDES | 0 |
|
SU1720044A1 |
| PLANAR OPTICAL WAVEGUIDE INVESTIGATION METHOD | 0 |
|
SU998894A1 |
| INTERFERENCE MULTIBEAM LIGHT FILTER (VERSIONS) | 2012 |
|
RU2491584C1 |
| 0 |
|
SU1562791A1 | |
| METHOD AND DEVICE FOR MEASURING PARAMETERS OF MODES OF PLANAR OPTICAL WAVEGUIDES | 1991 |
|
RU2022247C1 |
| DEVICE FOR MEASUREMENT OF PHOTOELASTIC CONSTANT MATERIALS | 0 |
|
SU1762206A1 |
