FIELD: measurement technology. SUBSTANCE: value of tested object shift is measured relative to formed receiving system of standard measuring base by alignment of center of extended uniform light mark positioned on object under test with measuring axis. Device allows realization of new schematic solution of standard measuring base formation in the form of equisensitive zone created by receiving system which includes lens and optically synthesized position-sensitive receiver with extended uniform lighting mark. EFFECT: enhanced accuracy of measurement. 3 cl, 2 dwg
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