DEVICE FOR INSPECTION OF THICKNESS AND RESISTIVITY OF CURRENT-CONDUCTING ITEMS Russian patent published in 2003 - IPC

FIELD: measuring equipment. SUBSTANCE: the device has a probe head, power source connected to one of the pairs of probes, current meter, two voltage meters. The probe head has at least six probes. The distance between three probes is less than that between the rest probes at least by 10 times. A pair of probes with a lower distance is connected to the first voltage meter. A pair of probes with a larger distance is connected to the second voltage meter. The pair of probes made up of one of the remaining probes of the group with a lower distance and one of the remaining probes of the group with a larger distance is connected to the power source and to the current meter. EFFECT: enhanced precision of measurement of mainly non-flat objects with a limited access to one of the surface. 5 cl, 2 dwg