FIELD: spectrometry. SUBSTANCE: invention refers to systems for injection of corrosives gases into ion source of mass spectrometer. Technical result of invention lies in development of simple but effective system for injection of chemically active gases, for example, uranium hexafluoride, into ion source ensuring minimal " memory effect " of mass spectrometer. Uranium hexafluoride is injected into ion source in the form of formed molecular beam. Employment of multivalve leak in mix of system secures formation of molecular beam with the help of emitter and diaphragm with rectangular section conduits under pressure of uranium hexafluoride in zone of beam formation in the order of 10-3 mm Hg. Values of memory coefficients corresponding to isotope 235U with use of injection system amounts to less than 1.003 with isotope content of 0.5- 5.0 atomic per cents. EFFECT: development of effective injection system. 3 cl, 4 dwg, 1 tbl
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Authors
Dates
2003-10-10—Published
2001-07-04—Filed