METHOD OF DETERMINATION OF PARAMETERS OF A FINE CRYSTAL STRUCTURE OF A POLYCRYSTALLINE MATERIAL Russian patent published in 2004 - IPC

FIELD: chemical technologies.

SUBSTANCE: the invention presents a method of determination of parameters of a fine crystal structure of a polycrystalline material and is dealt with the a method of a X-ray diffraction analysis. The method of determination of parameters of a fine crystal structure of a polycrystalline material provides for preparation of samples without a plastic deformation, action on a sample of a X-radiation for registration of its plastic deformation, determination of physical widenings (β) of two orders of reflection from one assemblage of the crystal planes, that is β₁ and β₂, and angular positions of gravity centers(θ) of the chosen lines, That is θ₁ θ₂, and determination by calculation of sizes of blocksD and the value of microstrains of a crystal lattice ε, and also the corresponding errors of measurements. The given invention is directed on magnifying of efficiency of the method at the expense of its simplification and raise of accuracy.

EFFECT: the invention allows to increase efficiency of the method at the expense of its simplification and raise of accuracy.

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