METHOD OF DETERMINATION OF YIELD POINT Russian patent published in 2004 - IPC

Abstract RU 2235986 C1

FIELD: tests of strength properties of materials; methods of determination of yield point.

SUBSTANCE: proposed consists in use of filament-like monocrystals and measurement of crystal lattice spacing by roentgen-structural method followed by calculation of yield point by the following formula: =c/(x/a₀)², where c is coefficient determined at point x=0.07a₀ and _max=G*x/a₀, where a₀ is crystal lattice spacing; x is displacement at shear.

EFFECT: reduced labor consumption; possibility of prediction of mechanical properties of material with its anisotropy taken into account.

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RU 2 235 986 C1

Authors

Badamshin I.Kh.

Dates

2004-09-10—Published

2002-12-16—Filed