METHOD AND DEVICE FOR MEASURING GEOMETRIC PARAMETERS OBJECTS WITH PROFILED SURFACES Russian patent published in 2004 - IPC

Abstract RU 2243503 C2

FIELD: measurement technology.

SUBSTANCE: narrow laser beam is directed onto tested surface and reflected beam is received by multi-element linear photo-array from other angular direction. Then videosignal is subject to processing which signal is used to measure distance to any point of inspected surface along Z axis. Then object moves along X and/or Y axis and co-ordinates of any point of inspected surface are simultaneously registered in computer memory to find real profile of inspected surface. Beam after having been passed through inspected surface is received additionally and co-ordinates of points of beginning and end of through pass of the beam are registered in computer memory to find co-ordinates and shapes of holes onto inspected surface. These points correspond to edge of inspected surface or edge of hole in it.

EFFECT: check of geometric parameters of objects with profiled surfaces.

6 cl, 1 dwg

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RU 2 243 503 C2

Authors

Galiulin R.M.

Galiulin R.M.

Bakirov Zh.M.

Vorontsov A.V.

Ponomarenko I.V.

Tumashinov A.V.

Dates

2004-12-27Published

2001-06-19Filed