FIELD: investigation of optical processes in pico- and femto-second ranges.
SUBSTANCE: proposed method involves establishment of ambiguous correlation between calibration marks on screen produced by electron beam coming from photocathode area illuminated by semiconductor pulse-modulated laser on screen region confined by shadow mask and respective time intervals used for time calibration in processing image converter time chart. This correlation is effected either using mathematical formula (in case of simple waveforms of sweep voltage) or by pre-numbering (during adjustment of image converter-recorder) at discrete points of sweep voltage. All these procedures make it possible to change laser mode of operation, that is to reduce requirements to its radiation thereby simplifying implementation of proposed method and reducing calibration error.
EFFECT: enhanced precision of time sweep calibration.
1 cl, 2 dwg
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IMAGE CONVERTER | 0 |
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Authors
Dates
2005-04-20—Published
2003-06-17—Filed